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    Titel :

    Reliability of proton-implanted VCSELs for data communication (Invited Paper) [2683-16]



    Kongress:

    Conference, Fabrication, testing, and reliability of semiconductor lasers ; 1996 ; San Jose; CA



    Erscheinungsdatum :

    1996-01-01


    Format / Umfang :

    12 pages


    Anmerkungen:

    Held as part of the SPIE OE/LASE '96 Symposium




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Nr. 2683

    DataCite | 1896


    Life-testing oxide-confined VCSELs: too good to last? [2683-17]

    Lear, K. L. / Kilcoyne, S. P. / Schneider, R. P. et al. | British Library Conference Proceedings | 1996


    Use of VCSEL arrays for parallel optical interconnects (Invited Paper) [2683-14]

    Lebby, M. S. / Gaw, C. A. / Jiang, W. et al. | British Library Conference Proceedings | 1996


    VCSEL optical subassembly for avionics fiber optic modules (Invited Paper) [2683-15]

    Hager, H. E. / Chan, E. Y. / Beranek, M. W. et al. | British Library Conference Proceedings | 1996


    Vertical-cavity surface-emitting lasers come of age (Invited Paper) [2683-04]

    Morgan, R. A. / Lehman, J. A. / Hibbs-Brenner, M. K. et al. | British Library Conference Proceedings | 1996