Reliability of proton-implanted VCSELs for data communication (Invited Paper) [2683-16]
Conference, Fabrication, testing, and reliability of semiconductor lasers ; 1996 ; San Jose; CA
1996-01-01
12 pages
Held as part of the SPIE OE/LASE '96 Symposium
Aufsatz (Konferenz)
Englisch
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