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    Titel :

    Chemical state mapping on material surfaces with the X1A second-generation scanning photoemission microscope (X1A SPEM-II) (Invited Paper) [2516-18]


    Beteiligte:
    Ko, C.-H. (Autor:in) / Kirz, J. (Autor:in) / Maier, K. (Autor:in) / Winn, B. (Autor:in) / Yun, W. / SPIE

    Kongress:

    Conference, X-ray microbeam technology and applcations ; 1995 ; San Diego; CA



    Erscheinungsdatum :

    1995-01-01


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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