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    Titel :

    Application of Robust Techniques to Model Fitting of Infrared Speckle Results of Binary and Extended Sources



    Kongress:

    2nd Conference, High-resolution imaging by interfometry: ground-based interferometry at visible and infrared wavelengths ; 1991 ; Garching; Germany



    Erscheinungsdatum :

    1992-01-01


    Format / Umfang :

    10 pages


    Anmerkungen:

    In 2 pts



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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